Electron Microscopy and Analysis Group

This is an IOP special interest group, which is a community of IOP members focused on a particular discipline, application or area of interest. Special interest groups allow members to connect and share knowledge and ideas. The IOP funds groups to deliver a range of activities including events, prizes and bursaries. All of our groups are driven by members.

About the group

As a special interest, member-driven group, we promote the development of new techniques in the physics community and encourage their use over a wide spectrum of applications.

Our members are from physics and cognate disciplines that include chemistry, engineering and materials science.

Our group’s broad-based interests in physics research attracts members from industry, academic establishments and government research organisations.

The use of electron beams for microscopy, lithography, structural and chemical analysis has become an indispensable tool in:

  • physics
  • biology
  • medicine
  • chemistry
  • metallurgy
  • mineralogy
  • materials science
  • electronic engineering

This trend is continuing as the range increases of analysis capabilities that overlap with other microscopies and associated techniques, including ion, light and scanning probe.

We started out as the Electron Microscopy Group in 1946 and changed our name in 1962.

What the group does

We welcome collaboration in areas common to physical and biological applications, particularly with those interested in instrumental or technique development.

We also support younger members to attend meetings and conferences. 

Email groups@iop.org to find out more.

Would you like to join this group?

EMAG conference 2020

6-8 July 2020, The Royal College of Physicians and Surgeons, Glasgow

Microscopy enabled by direct electron detection - call for papers

The conference

  • There will be an opening reception and plenary at The Lighthouse.
  • It will be a single session format conference focusing on microscopy enabled by direct electron detection.
  • A table-top trade exhibition will be held for delegates to explore the latest advances in instrumentation.

Confirmed speakers

  • Dr Knut Muller Caspary (Jullich, Germany). "Developments in 4D STEM for momentum resolution and differential phase contrast imaging"
  • Professor Peter Nellist (University of Oxford, UK). "Imaging of low-Z and beam sensitive materials using 2D and 4D STEM"
  • Professor Colin Ophus (Berkeley, USA). "New phase contrast and diffractive imaging methods enabled by 4D-STEM"
  • Professor John Rodenburg (University of Sheffield, UK). "Ptychography - an old name for a modern revolution in imaging"
  • Dr Carol Trager-Cowan (University of Strathclyde, UK). "Direct electron detectors for diffraction studies in the scanning electron microscope"


Prizes will be awarded to the best student contributions (oral, flash and poster). 


Find group events on the IOP events portal.


January 2020 (PDF, 1.3MB)
January 2019 (PDF, 1.17MB)
January 2018 (PDF, 700KB)

Useful links

Committee and contacts

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