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Volume 45, Number 1, February 2008
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SHORT COMMUNICATION |
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| L1 | A non-parametric coverage interval Shuo-Huei Lin, Wenyaw Chan and Lin-An Chen
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PAPERS |
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| 1 | Uncertainty of experimental integrals: application to the UV index calculation Raul R Cordero, Gunther Seckmeyer, Darius Pissulla and Fernando Labbe
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| 11 | Reducing photodiode reflectance by Brewster-angle operation Meelis Sildoja, Farshid Manoocheri and Erkki Ikonen
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| 16 | Impurity dependence of the Sn-point and the properties of the Sn–Fe 'eutectic' John Ancsin
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| 21 | Simple uncertainty evaluation method for an interferometric flatness measurement machine using a calibrated test flat Youichi Bitou, Toshiyuki Takatsuji and Kensei Ehara
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| 27 | An improved matrix method for evaluating UTC offset uncertainties in the presence of link noises Charles A Greenhall
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| 35 | GPS All in View time transfer for TAI computation G Petit and Z Jiang
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| 46 | The use of diaphragm bellows to construct a constant pressure gas flowmeter for the flow rate range 10−7 Pa m3 s−1 to 10−1 Pa m3 s−1 T Gronych, L Peksa, P Repa, J Wild, J Tesař, D Pražák, Z Krajíček and M Vičar
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| 53 | Uncertainty propagation of atomic weight measurement results Juris Meija and Zoltán Mester
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| 63 | An inconsistency in uncertainty analysis relating to effective degrees of freedom R Willink
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| 68 | Loss measurements on superconducting Nb by a cryogenic dual compensated calorimeter for the implementation of the kilogram standard by the levitation mass method H Kajastie, K K Nummila, A Rautiainen, K Riski and A Satrapinski
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| 75 | Melting points of gallium and of binary eutectics with gallium realized in small cells A Burdakin, B Khlevnoy, M Samoylov, V Sapritsky, S Ogarev, A Panfilov, G Bingham, V Privalsky, J Tansock and T Humpherys
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| 83 | Uncertainties on distance and chromatic dispersion measurement using optical low-coherence reflectometry A-F Obaton, A Quoix and J Dubard
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| 93 | Constraints on a synthetic-noise source for Johnson noise thermometry D R White and S P Benz
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| 102 | Current status of the quantum metrology triangle Mark W Keller
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| 110 | Influence of surface stress in the determination of the (2 2 0) lattice spacing of silicon L Ferroglio, G Mana, C Palmisano and G Zosi
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INTERNATIONAL REPORT |
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| 119 | News from the BIPM—2007 Andrew Wallard
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ERRATUM |
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| 127 | The selection of water property formulae for volume and flow calibration Elsa Batista and Richard Paton
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