Measurement Science and Technology

2008 Measurement Science and Technology Outstanding Paper Awards
Read the winning papers

NEW Special feature celebrating the 65th Birthday of Professor Peter Hauptmann
This special feature celebrates Professor Hauptmann’s outstanding contribution to his field and to this journal. Guest Editors Dr Ralf Lucklum and Professor Srinivas Tadigadapa have put together a collection of papers to mark the occasion, with contributions from his colleagues past and present.

NEW Call for papers to a Special Issue dedicated to Wireless Sensor Networks: designing for real-world deployment and deployment experiences
An invitation to submit to this Special Issue led by Guest Editor Professor Elena Gaura, Coventry University, UK.

Multimedia in Measurement Science and Technology
Information on how to enhance your article with multimedia files including a selection of outstanding examples.

Free Topical Review articles

MST MOSAIC Project

Regular issues

Latest issue (complete) No 3, March 2010 (032001-039801)
Open issue No 4, April 2010 (042001-047001)

Forthcoming articles
An advance list of articles that have been accepted for publication.

Featured articles
These high-interest recent articles are all free to read.

This Month's Papers
As a service to authors, all papers published in our journals are free for 30 days from the date of online publication. To make the most of this service, sign up for free e-alerts to find out when the latest papers are published in your field.

Special Issues
Special issues and features published in Measurement Science and Technology: new in the December 2009 issue read the special feature celebrating the 65th birthday of our Editor-in-Chief, Professor Peter Hauptmann.

Highlights of 2008
A special collection of some of the best articles published during 2008.

Most cited papers
The most cited articles in 2008.

Most read papers
The top 30 most downloaded articles of 2008.

Subject sections
Papers in Measurement Science and Technology are categorized into broad subject sections.

Free to developing and low income countries
Access to the content of Measurement Science and Technology is free to selected developing and low-income countries, please click here for more information.

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