Editorial board

Editor-in-Chief
E Garcia, Cornell University, Ithaca, NY, USA

Editorial Board
D Abbott, University of Adelaide, Australia
G Akhras, Royal Military College of Canada, Ontario, Canada
C Boller, Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren, Dresden, Germany
J Cagnol, Pôle Universitaire Léonard de Vinci, Paris, France
G Carman, University of California-Los Angeles, USA
F-K Chang, Stanford University, CA, USA
S-B Choi, Inha University, Incheon, Korea
S H Choi, NASA Langley Research Center, Hampton, VA, USA
A Del Grosso, Università degli Studi di Genova, Italy
D Erickson, Cornell University, Ithaca, NY, USA
A Flatau, University of Maryland, College Park, USA
U Gabbert, Universität Magdeburg, Germany
A Güemes, Universidad Politecnica de Madrid, Spain
S Gopalakrishnan, Indian Institute of Science, Bangalore, India
J Kim, Inha University, Incheon, Korea
S J Kim, Seoul National University, Korea
D Lagoudas, Texas A&M University, College Station, USA
C K Lee, National Taiwan University, Taiwan
J Leng, Harbin Institute of Technology, China
D Leo, Virginia Tech, Blacksburg, USA
W H Liao, Chinese University of Hong Kong, China
C S Lynch, University of California-Los Angeles, USA
S Masri, University of Southern California, Los Angeles, USA
Y Matsuzaki, Nagoya University, Japan
W M Ostachowicz, Polish Academy of Sciences, Gdansk, Poland
K Peters, North Carolina State University, Raleigh, USA
D J Pines, University of Maryland, College Park, USA
M Shahinpoor, University of New Mexico, Albuquerque, USA
H Sodano, Arizona State University, Tempe, USA
G Song, University of Houston, TX, USA
W J Staszewski, University of Sheffield, UK
N Takeda, University of Tokyo, Japan
G Wallace, University of Wollongong, Australia
Q Wang, University of Manitoba, Canada
N M Wereley, University of Maryland, College Park, USA
W J Wu, National Taiwan University, Taiwan