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In-situ Scanning Transmission X-ray Microscopy of catalytic materials under reaction conditions

Emiel de Smit et al 2009 J. Phys.: Conf. Ser. 190 012161 (4pp)   doi: 10.1088/1742-6596/190/1/012161  Help

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Emiel de Smit1, J Fredrik Creemer2, Henny W Zandbergen3, Bert M Weckhuysen1 and Frank M F de Groot1
1 Inorganic Chemistry and Catalysis group, Debye Institute for Nanomaterials Science, Utrecht University, Sorbonnelaan 16, 3584 CA Utrecht, Netherlands
2 DIMES-ECTM, Delft University of Technology, 2600 GB Delft, The Netherlands
3 Kavli Institute of NanoScience, National Centre for High Resolution Electron Microscopy, Delft University of Technology, 2600 GA Delft, The Netherlands
E-mail: e.desmit@uu.nl

Abstract. In-situ Scanning X-ray Transmission Microscopy (STXM) allows the measurement of the soft X-ray absorption spectra with 10 to 30 nm spatial resolution under realistic reaction conditions. We show that STXM-XAS in combination with a micromachined nanoreactor can image a catalytic system under relevant reaction conditions, and provide detailed information on the morphology and composition of the catalyst material. The nanometer resolution combined with powerful chemical speciation by XAS and the ability to image materials under realistic conditions opens up new opportunities to study many chemical processes.

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