Surface antiferromagnetic coupling of Fe/Cu(001) induced by NO adsorpion studied by means of depth-resolved XMCD method

doi:10.1088/1742-6596/190/1/012109

Surface antiferromagnetic coupling of Fe/Cu(001) induced by NO adsorpion studied by means of depth-resolved XMCD method

Hitoshi Abe et al 2009 J. Phys.: Conf. Ser. 190 012109 (6pp) doi: 10.1088/1742-6596/190/1/012109

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Hitoshi Abe¹, Masako Sakamaki² and Kenta Amemiya³
¹ Department of Chemistry, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Yokohama, Kanagawa 223–8522, Japan
² Graduate School of Advanced Integration Science, Chiba University, 1–33 Yayoi-cho, Inage, Chiba, 263–8522, Japan
³ Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1–1 Oho, Tsukuba, Ibaraki 305–0801, Japan
³ Japan Science and Technology Agency, CREST, 4-1-8 Hon-chou, Kawaguchi-shi, Saitama 332–0012, Japan
E-mail: hitoshi@chem.keio.ac.jp

Abstract. Effects of NO adsorption on the magnetism of Fe(2 and 4 ML)/Cu(001) films have been studied. XMCD spectra have been measured for the films before and after NO adsorption. The bare 4 ML Fe film is magnetized perpendicularly, and m_s^eff is 2.5 μ_B. However, the NO adsorbed 4 ML Fe film exhibits in-plane magnetization and shows m_s^eff of 1.2 μ_B, which is about a half of m_s^eff of the bare film. The apparent fifty percent reduction of m_s^eff can be attributed to an idea that m_s^eff of 1 ML aligns in the opposite direction to that of the other 3 MLs'. This antiferromagnetic coupling between the topmost layer and the other layers is suggested by the careful analyses of the depth resolved XMCD spectra.

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Surface antiferromagnetic coupling of Fe/Cu(001) induced by NO adsorpion studied by means of depth-resolved XMCD method

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