Depth profiling of magnetic and atomic structures of ultrathin films by depth-resolved XMCD and XAFS techniques with a sub-nm depth resolution

doi:10.1088/1742-6596/190/1/012108

Depth profiling of magnetic and atomic structures of ultrathin films by depth-resolved XMCD and XAFS techniques with a sub-nm depth resolution

K Amemiya et al 2009 J. Phys.: Conf. Ser. 190 012108 (12pp) doi: 10.1088/1742-6596/190/1/012108

PDF (1.94 MB) | References

K Amemiya^1,2,6, J Miyawaki³, H Abe⁴, E O Sako¹ and M Sakamaki⁵
¹ Institute of Materials Structure Science, High Energy Accelerator Research Organization, Tsukuba, Ibaraki 305–0801, Japan
² Japan Science and Technology Agency, CREST, Kawaguchi, Saitama 332–0012, Japan
³ Soft X-ray Spectroscopy Laboratory, RIKEN SPring-8 Center, Sayo, Sayo, Hyogo 679–5148, Japan
⁴ Department of Chemistry, Faculty of Science and Technology, Keio University, Yokohama, Kanagawa 223–8522, Japan
⁵ Graduate School of Advanced Integration Science, Chiba University, Yayoi-cho, Inage, Chiba 263–8522, Japan
⁶ To whom any correspondence should be addressed
E-mail: kenta.amemiya@kek.jp

Abstract. Recent progresses in the depth-resolved X-ray magnetic circular dichroism (XMCD) and X-ray absorption fine structure (XAFS) techniques are presented. The depth-resolved atomic and magnetic structures of Co films grown on Ru(0001) was investigated by using the depth-resolved XMCD and extended X-ray absorption fine structure EXAFS. The three-dimensional magnetic structure of a micro-patterned Fe/Ni/Cu(100) film was studied by combining the depth-resolved XMCD with the X-ray microbeam. The technique was also applied to Co thin films covered with a relatively thick Mo overlayer, in order to demonstrate the possibility to investigate ex-situ samples with a protection layer.

Post to CiteUlike |

Post to Connotea |

Post to Bibsonomy

Depth profiling of magnetic and atomic structures of ultrathin films by depth-resolved XMCD and XAFS techniques with a sub-nm depth resolution

Find related articles

Article options

Authors & Referees