XAFS studies on a modified Al-Si hypoeutectic alloy

doi:10.1088/1742-6596/190/1/012068

XAFS studies on a modified Al-Si hypoeutectic alloy

V S Prakash Srirangam et al 2009 J. Phys.: Conf. Ser. 190 012068 (4pp) doi: 10.1088/1742-6596/190/1/012068

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V S Prakash Srirangam¹, S Chattopadhyay^2,3, T Shibata^2,3, J A Kaduk⁴, J T Miller⁵, C U Segre² and S Shankar¹
¹ Light Metal Casting Research Center, Mechanical Engineering Department, McMaster University, Hamilton, Ontario, L8S 4L7, Canada
² CSRRI & BCPS Department, Illinois Institute of Technology, Chicago, IL 60616, USA
³ Materials Research Collaborative Access Team, Sector 10, Advanced Photon Source, Argonne, IL 60439, USA
⁴ Poly Crystallography, Inc., 423 East Chicago Avenue, Naperville, Il 60540, USA
⁵ Argonne National Laboratory, CSE, 9700 S. Cass Ave, Argonne, IL 60439, USA
E-mail: sriranvs@mcmaster.ca

Abstract. To understand the role of Sr in doped aluminium-silicon alloys, we have conducted for the first time, Sr- K edge XAFS measurements on Al-3%Si-0.04%Sr. Aluminium-Silicon alloys are widely used in automobile and aerospace applications. Modification of these alloys with addition of trace levels of Sr (200–400 ppm) results in changing the morphology of Si eutectic from "plate" like structure to "fibrous" structure. Several theories have been proposed to understand the mechanism of modification of eutectic phases with Sr addition in these alloys, but there is no conclusive evidence in support of these theories. From our XAFS analysis, we suggest Sr-Si bonds and Sr-Sr correlations may be responsible for the morphological transformation observed in the alloy.

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XAFS studies on a modified Al-Si hypoeutectic alloy

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