Abstract. The optical layout of the XAFS beamline at ELETTRA is presented along with its powerful capabilities for collecting XAFS spectra in a wide energy range 2.4 – 27 keV. Recent developments around the ensemble of available instruments made available different collection modes using various sample environments. In particular combined x-ray absorption and diffraction patterns can be collected even at high temperature using a special version of the l'Aquila-Camerino furnace and a MAR image-plate detector. An automated beamline control software allows us to perform successive measurements in different conditions without attending the beamline. Examples of XAFS and diffraction measurements, as well as single-energy temperature scans are presented showing the performances of the beamline for nanocrystalline systems and liquid metals under high temperature conditions.