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High-resolution hard-X-ray fluorescence spectrometer

Evgueni Kleimenov et al 2009 J. Phys.: Conf. Ser. 190 012035 (6pp)   doi: 10.1088/1742-6596/190/1/012035  Help

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Evgueni Kleimenov1, Anna Bergamaschi1, Jeroen van Bokhoven2, Markus Janousch1, Bernd Schmitt1 and Maarten Nachtegaal1
1 Paul Scherrer Institut, CH-5232 Villigen, Switzerland
2 ETH Zurich, Institute for Chemical and Bioengineering, 8093 Zurich, Switzerland
E-mail: evgueni.kleimenov@psi.ch and maarten.nachtegaal@psi.ch

Abstract. A Johann-type X-ray fluorescence spectrometer for XES, RXES/RIXS, HERFD XAS and RXS experiments was designed, constructed and commissioned at the X10DA-SuperXAS beamline of the Swiss Light Source. The spectrometer consists of three key elements: a sample manipulator, an X-ray dispersive element (spherically bent silicon or germanium crystal), and an one-dimensional-array X-ray detector. The detected X-ray fluorescence energy is scanned by changing the angle between the sample, crystal and detector. The energy resolution of the spectrometer ranges from sub-eV to several eV. Thanks to the use of a one-dimensional array detector the spectrometer is easy to align and operate.

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