Abstract. The effect of stochastic noise on Extended X-ray Absorption Fine Structure (EXAFS) data measurement, analysis, and fitting is discussed. Stochastic noise reduces the ability to uniquely fit a calculated model to measured EXAFS data. Such noise can be reduced by common methods that increase the signal-to-noise ratio; however, these methods are not always practical. Therefore, predetermined, quantitative knowledge of the level of acceptable stochastic noise when fitting for a particular model system is essential in maximizing the chances of a successful EXAFS experiment and minimizing wasted beamtime. This paper outlines a method to estimate, through simulation, the acceptable level of stochastic noise in EXAFS spectra that still allows a successful test of a proposed model compound.