Abstract. The physical origins of negative refractive index are derived from a dilute microscopic model, producing a result that is generalized to the dense condensed phase limit. In particular, scattering from a thin sheet of electric and magnetic dipoles driven above resonance is used to form a fundamental description for negative refraction. Of practical significance, loss and dispersion are implicit in the microscopic model. While naturally occurring negative index materials are unavailable, ferromagnetic and ferroelectric materials provide device design opportunities.

An erratum page was added to the end of the published paper on 11 November 2005.

Received 31 March 2005
Published 7 October 2005