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Calculated structural, elastic and electronic properties of SiX2O4 (X = Mg, Zn, Cd) compounds under pressure

A Bouhemadou et al 2007 Modelling Simul. Mater. Sci. Eng. 15 787-798   doi: 10.1088/0965-0393/15/7/006  Help

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A Bouhemadou1,3 and R Khenata2
1 Department of Physics, Faculty of Science, University of Setif, 19000 Setif, Algeria
2 Laboratoire de Physique Quantique et de Modélisation Mathématique (LPQ3M), Département de Technologie, Université de Mascara, 29000 Mascara, Algeria
3 Author to whom any correspondence should be addressed.
E-mail: a_bouhemadou@yahoo.fr

Abstract. Using first-principles density functional calculations, the effect of high pressures, up to 30 GPa, on the structural, elastic and electronic properties of SiX2O4, with X = Mg, Zn and Cd, was studied by means of the pseudo-potential plane-waves method. We used both the local density approximation and the generalized gradient approximation to the exchange-correlation approximation energy. The results of bulk properties, including lattice constants, internal parameters, bulk modulus and derivatives, are obtained. The elastic constants and their pressure dependence are calculated using the static finite strain technique. We derived the bulk modulus, shear modulus, Young's modulus and Poisson's ratio for ideal polycrystalline SiX2O3 aggregates. We estimated the Debye temperature of SiX2O4 from the average sound velocity. Band structure, density of states and pressure coefficients of some gaps are also given. This is the first quantitative theoretical prediction of the elastic and electronic properties of SiMg2O4, SiZn2O4 and SiCd2O4 compounds, and still awaits experimental confirmation.

Print publication: Issue 7 (October 2007)
Received 31 March 2007, in final form 6 August 2007
Published 4 October 2007

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