journals.iop.org home page electronic journals * User guide   * Site map   | Quick Search:Help  
Smart Materials and Structures
Athens/Institutional login
IOP login: Password:   
Create account | Alerts | Contact us
Journals Home | Journals List | EJs Extra | This Journal | Search | Authors | Referees | Librarians | User Options | Help |

Characterization of thermally evaporated thin films of Rhodamine 6G

S K Tripathi et al 2009 Smart Mater. Struct. 18 125012 (7pp)   doi: 10.1088/0964-1726/18/12/125012  Help

   PDF (421 KB) | References

S K Tripathi, Alka Monga and G S S Saini
Department of Physics, Centre of Advanced Study in Physics, Panjab University, Chandigarh 160014, India
E-mail: surya@pu.ac.in and surya_tr@yahoo.com

Abstract. The present paper reports the study of Rhodamine 6G (R6G) in thin film form and its structural, optical and electrical characterization. The R6G films are found to have an amorphous structure as determined using the x-ray diffraction technique. The FTIR spectra of R6G thin film confirms that this molecule does not dissociate on being thermally evaporated and thus this technique can be used to deposit the thin films. The fluorescence and transmission spectra, of the thin film, show a redshift in peaks. Temperature dependence of dark conductivity (σd) and photoconductivity (σph) measurements, in the temperature range 303–403 K, confirms that the conduction in R6G is through an activated process having a single activation energy. The photoactivation energy (Eph) value is smaller in comparison to the activation energy in dark (Ed).

Print publication: Issue 12 (December 2009)
Received 27 January 2009, in final form 26 June 2009
Published 6 October 2009

Bookmark and Share Post to CiteUlike | Post to Connotea | Post to Bibsonomy

 

Find related articles





Article options

Authors & Referees

IOP Journal Archiveauthor services
 
Content finder
  Full Search
  Help


  
Setup information is available for Adobe Acrobat.
EndNote, ProCite ® and Reference Manager ® are registered trademarks of ISI Researchsoft.
Copyright © Institute of Physics and IOP Publishing Limited 2009.
Use of this service is subject to compliance with the Terms and Conditions of use. In particular, reselling and systematic downloading of files is prohibited.
Help: Cookies | Data Protection. Privacy policy Disclaimer