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Fabrication of submicrometre buried gold - palladium wires on using electron beam lithography

V Rousset et al 1996 Nanotechnology 7 144-152   doi: 10.1088/0957-4484/7/2/008  Help

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V Rousset-+, S Itoua-+, C Joachim-+, F Tsobnang++, B Rousset§ and H H Pham§
-+ CEMES-LOE/CNRS, 29 Rue J Marvig, BP 4347, 31055 Toulouse Cédex, France
++ Alcatel - Alsthom Recherche, Route de Nozay, 91460 Marcoussis, France
§ LAAS, 7 Avenue du Colonel Roche, 31077 Toulouse Cédex, France

Abstract. A process is presented to fabricate a coplanar buried metal - - metal junction on the surface. The surface is etched with reactive ion etching (RIE) through a PMMA mask where the junction patterns have been defined using the e-beam technique. The buried AuPd metallic wires of the junction, 200 nm in width and 10 nm in thickness, are fabricated by the lift-off technique. After the RIE step, the difficulties of reaching an electrode separation in the 40 nm range on are also discussed.

Print publication: Issue 2 (June 1996)
Received 19 October 1994, accepted for publication 12 September 1995

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