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Quantitative force measurements using frequency modulation atomic force microscopy—theoretical foundations

John E Sader et al 2005 Nanotechnology 16 S94-S101   doi: 10.1088/0957-4484/16/3/018  Help

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John E Sader1,4, Takayuki Uchihashi2, Michael J Higgins2, Alan Farrell2, Yoshikazu Nakayama3 and Suzanne P Jarvis2
1 Department of Mathematics and Statistics, University of Melbourne, Victoria, 3010, Australia
2 SFI Nanoscience Laboratory, Lincoln Place Gate, Trinity College, Dublin 2, Republic of Ireland
3 Department of Physics and Electronics, Osaka Prefecture University, Osaka, Japan
4 Author to whom any correspondence should be addressed
E-mail: jsader@unimelb.edu.au

Abstract. Use of the atomic force microscope (AFM) in quantitative force measurements inherently requires a theoretical framework enabling conversion of the observed deflection properties of the cantilever to an interaction force. In this paper, the theoretical foundations of using frequency modulation atomic force microscopy (FM-AFM) in quantitative force measurements are examined and rigorously elucidated, with consideration being given to both 'conservative' and 'dissipative' interactions. This includes a detailed discussion of the underlying assumptions involved in such quantitative force measurements, the presentation of globally valid explicit formulae for evaluation of so-called 'conservative' and 'dissipative' forces, discussion of the origin of these forces, and analysis of the applicability of FM-AFM to quantitative force measurements in liquid.

Print publication: Issue 3 (March 2005)
Received 22 November 2004, in final form 12 December 2004
Published 25 January 2005

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