|
|
|
|||
| Journals Home | Journals List | EJs Extra | This Journal | Search | Authors | Referees | Librarians | User Options | Help | | ||||
2005 Nanotechnology 16 S94-S101 doi: 10.1088/0957-4484/16/3/018
![]()
|
||||
Abstract. Use of the atomic force microscope (AFM) in quantitative force measurements inherently requires a theoretical framework enabling conversion of the observed deflection properties of the cantilever to an interaction force. In this paper, the theoretical foundations of using frequency modulation atomic force microscopy (FM-AFM) in quantitative force measurements are examined and rigorously elucidated, with consideration being given to both 'conservative' and 'dissipative' interactions. This includes a detailed discussion of the underlying assumptions involved in such quantitative force measurements, the presentation of globally valid explicit formulae for evaluation of so-called 'conservative' and 'dissipative' forces, discussion of the origin of these forces, and analysis of the applicability of FM-AFM to quantitative force measurements in liquid.
Print publication: Issue 3 (March 2005)| Post to CiteUlike | | Post to Connotea | | Post to Bibsonomy |
|
Journals Home | Journals List | EJs Extra | This Journal | Search | Authors | Referees | Librarians | User Options | Help | Recommend this journal EndNote, ProCite ® and Reference Manager ® are registered trademarks of ISI Researchsoft. Copyright © Institute of Physics and IOP Publishing Limited 2009. Use of this service is subject to compliance with the Terms and Conditions of use. In particular, reselling and systematic downloading of files is prohibited. Help: Cookies | Data Protection. Privacy policy Disclaimer |