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Ferroelectric catastrophe: beyond nanometre-scale optical resolution

Junji Tominaga et al 2004 Nanotechnology 15 411-415   doi: 10.1088/0957-4484/15/5/001  Help

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Junji Tominaga, Takayuki Shima, Masashi Kuwahara, Toshio Fukaya, Alexander Kolobov and Takashi Nakano
Centre for Applied Near-Field Optics (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central #4, 1-1-1 Higashi, Tsukuba 305-8562, Japan
E-mail: j-tominaga@aist.go.jp

Abstract. The optical diffraction limit is rigidly determined as a simple equation of wavelength λ and lens numerical aperture NA ({\leqslant }1 ): λ/2/NA. In this paper, we report that Ag5.8In4.4Sb61.0Te28.8 and Ge2Sb2Te5 chalcogenide thin films, which are typical of optical recording materials used in digital versatile discs (DVDs), enable a resolution of under λ/10 due to their ferroelectric properties. In the Ag5.8In4.4Sb61.0Te28.8 film it was found that this optical super-resolution can be observed between 350 and 400 °C, resulting in a second phase transition from a hexagonal (A7 belonging to R\bar
{3}m ) to a rhombohedral structure of R32 or R3m. In Ge2Sb2Te5, on the other hand, the temperature range is much wider, between 250 and 450 °C, which is also due to a second phase transition from a NaCl-type fcc to a hexagonal structure.

Print publication: Issue 5 (May 2004)
Received 15 August 2003, in final form 25 November 2003
Published 29 January 2004

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