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2004 Nanotechnology 15 411-415 doi: 10.1088/0957-4484/15/5/001
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Abstract.
The optical diffraction limit is rigidly determined as a simple equation of wavelength
λ
and lens numerical aperture NA (
): λ/2/NA. In this paper,
we report that Ag5.8In4.4Sb61.0Te28.8
and Ge2Sb2Te5
chalcogenide thin films, which are typical of optical recording materials
used in digital versatile discs (DVDs), enable a resolution of under
λ/10 due to their ferroelectric
properties. In the Ag5.8In4.4Sb61.0Te28.8
film it was found that this optical super-resolution can be observed between 350 and
400 °C, resulting in a second phase transition from a hexagonal (A7 belonging to
) to a rhombohedral structure of
R32 or
R3m.
In Ge2Sb2Te5, on the other hand, the temperature range is much wider, between 250 and
450 °C, which is also due to a second phase transition from a NaCl-type fcc to a hexagonal
structure.
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