journals.iop.org home page electronic journals * User guide   * Site map   | Quick Search:Help  
Nanotechnology
Athens/Institutional login
IOP login: Password:   
Create account | Alerts | Contact us
Journals Home | Journals List | EJs Extra | This Journal | Search | Authors | Referees | Librarians | User Options | Help |

Nanostructured chiral surfaces

K-H Ernst et al 1999 Nanotechnology 10 355-361   doi: 10.1088/0957-4484/10/3/320  Help

   PDF (967 KB) | Gzipped PS (3.80 MB) | References | Articles citing this article

K-H Ernst-+, M Böhringer-+, C F McFadden-+, P Hug-+, U Müller-+ and U Ellerbeck++
-+ Swiss Federal Laboratories for Materials Testing and Research (EMPA) Surface Technologies, Ueberlandstrasse 129, CH-8600 Dübendorf, Switzerland
++ Institute of Organic Chemistry, Free University Berlin, Germany

Abstract. Chiral organic surfaces were generated via adsorption of the pure enantiomers of heptahelicene, a helically shaped aromatic hydrocarbon, on a Ni(111) surface in ultra high vacuum. Time-of-flight secondary mass spectrometry (ToF-SIMS) revealed that the molecule stays intact at room temperature. The formation of a two-dimensionally ordered structure at monolayer coverage is observed via low-energy electron diffraction (LEED) and scanning tunnelling spectroscopy (STM). For creation of a chiral metal film, the chiral organic monolayer was subjected to subsequent metal physical vapour deposition. Differences in morphology of grown copper and palladium films were only observed when heptahelicene was adsorbed prior to deposition. No screw dislocations with preferred handedness were observed when the pure enantiomers were used.

Print publication: Issue 3 (September 1999)
Received 14 January 1999, in final form 26 May 1999

Bookmark and Share Post to CiteUlike | Post to Connotea | Post to Bibsonomy

 


Find related articles





Article options

Authors & Referees

 
Content finder
  Full Search
  Help


  
Setup information is available for Adobe Acrobat and Gzip compressed PostScript.
EndNote, ProCite ® and Reference Manager ® are registered trademarks of ISI Researchsoft.
Copyright © Institute of Physics and IOP Publishing Limited 2009.
Use of this service is subject to compliance with the terms and conditions of use. In particular, reselling and systematic downloading of files is prohibited.
Help: Cookies | Data Protection.