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TOPICAL REVIEW

Noise in MEMS

F Mohd-Yasin et al 2010 Meas. Sci. Technol. 21 012001 (22pp)   doi: 10.1088/0957-0233/21/1/012001  Help

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F Mohd-Yasin1, D J Nagel2 and C E Korman2
1 Faculty of Engineering, Multimedia University, 63100 Cyberjaya, Selangor, Malaysia
2 Department of ECE, The George Washington University, Washington, DC 20052, USA

Abstract. This review provides a comprehensive survey of noise research in MEMS. Some background on noise and on MEMS is provided. We review noise production mechanisms, and highlight work on the theory and modeling of noise in MEMS. Then noise measurements in the specific types of MEMS are reviewed. Inertial MEMS (accelerometers and angular rate sensors), pressure and acoustic sensors, optical MEMS, RF MEMS, surface acoustic wave devices, flow sensors, and chemical and biological MEMS, as well as data storage devices and magnetic MEMS, are reviewed. We indicate opportunities for additional experimental and computational research on noise in MEMS.

Keywords: noise, MEMS, micro systems

Print publication: Issue 1 (January 2010)
Received 6 August 2007, in final form 6 July 2009
Published 6 November 2009

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