Dynamic hysteresis scaling of ferroelectric Pb0.9Ba0.1(Zr0.52Ti0.48)O3 thin films

doi:10.1088/0953-8984/21/48/485901

Dynamic hysteresis scaling of ferroelectric Pb_0.9Ba_0.1(Zr_0.52Ti_0.48)O₃ thin films

Y Y Guo et al 2009 J. Phys.: Condens. Matter 21 485901 (8pp) doi: 10.1088/0953-8984/21/48/485901

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Y Y Guo¹, T Wei¹, Q Y He² and J-M Liu^1,2,3,4
¹ Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, People's Republic of China
² School of Physics, South China Normal University, Guangzhou 510006, People's Republic of China
³ International Center for Materials Physics, Chinese Academy of Sciences, Shenyang, People's Republic of China
⁴ Author to whom any correspondence should be addressed
E-mail: liujm@nju.edu.cn

Abstract. We measure systematically the intrinsic scaling behavior of dynamic hysteresis for Pb_0.9Ba_0.1(Zr_0.52Ti_0.48)O₃ (PBZT) ferroelectric thin films with Pt electrodes on Si substrates, utilizing the Sawyer–Tower technique. For the as-prepared thin films of similar thickness and microstructure, over the low frequency range, the scaling follows the power law $\langle A \rangle \propto f^{0.28}E_{0}^{0.91}$ under low E₀ and the power law $\langle A \rangle \propto f^{0.35}E_{0}^{0.78}$ under high E₀, where lang A rang is the hysteresis area, and f and E₀ are the frequency and amplitude of the external electric field. In the high- f range, the power law for low E₀ takes the form of $\langle A \rangle \propto f^{-0.32}E_{0}^{3.2}$ , while that for high E₀ takes the form of $\langle A \rangle \propto f^{-0.2}E_{0}^{2.2}$ . It is identified that the dynamic behaviors at low frequency mainly come from the intrinsic domain reversal instead of others like the leakage current, while the depolarization field may influence the frequency exponents at high frequency. We study the temperature scaling of the hysteresis, indicating that the scaling under low E₀ is roughly consistent with the (Φ²)² model. Finally, we argue that experimentally obtained power law scaling for Pb(Zr_0.52Ti_0.48)O₃ thin films prepared under the given conditions may not be reliable due to the polarization fatigue effect.

Print publication: Issue 48 (2 December 2009)
Received 6 August 2009, in final form 24 September 2009
Published 30 October 2009

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Dynamic hysteresis scaling of ferroelectric Pb_0.9Ba_0.1(Zr_0.52Ti_0.48)O₃ thin films

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