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2009 J. Phys.: Condens. Matter 21 474217 (22pp) doi: 10.1088/0953-8984/21/47/474217
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Abstract.
The change in structure of glassy
GeS2
with pressure increasing to
at ambient temperature was explored by using in situ neutron and x-ray diffraction. Under
ambient conditions, the glass structure is made from a mixture of corner- and edge-sharing
Ge(S1/2)4
tetrahedra where 47(5)% of the Ge atoms are involved in edge-sharing
configurations. The network formed by these tetrahedra orders on an
intermediate range as manifested by the appearance of a pronounced first sharp
diffraction peak in the measured total structure factors at a scattering vector
k = 1.02(2) Å−1
which has a large contribution from Ge–Ge correlations. The intermediate
range order breaks down when the pressure on the glass increases above
2 GPa
but there does not appear to be a significant alteration of the Ge–S coordination number or
corresponding bond length with increasing density. The results for the glass are consistent
with a densification mechanism in which there is a replacement of edge-sharing by
corner-sharing Ge centred tetrahedral motifs and/or a reduction in the Ge–
–Ge bond angle between corner-sharing tetrahedral motifs with increasing pressure. The
change in structure with increasing temperature at a pressure of
was also investigated by means of in situ x-ray diffraction as the glass crystallized and
then liquefied. At 5.2(1) GPa and 828(50) K the system forms a tetragonal crystal, with
space group
and cell parameters a = b = 4.97704(12)
and c = 9.5355(4) Å, wherein
corner-sharing Ge(S1/2)4
tetrahedra pack to form a dense three-dimensional network. A method is described for
correcting x-ray diffraction data taken in situ under high pressure, high temperature
conditions for a cylindrical sample, container and gasket geometry with a parallel
incident beam and with a scattered beam that is defined using an oscillating radial
collimator. A method is also outlined for obtaining coordination numbers from
direct integration of the peaks in measured x-ray total pair distribution functions.
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