Quantitative Rietveld texture analysis of CaSiO3 perovskite deformed in a diamond anvil
cell

doi:10.1088/0953-8984/18/25/S07

Quantitative Rietveld texture analysis of CaSiO₃ perovskite deformed in a diamond anvil cell

Lowell Miyagi et al 2006 J. Phys.: Condens. Matter 18 S995-S1005 doi: 10.1088/0953-8984/18/25/S07

PDF (603 KB) | References | Articles citing this article

Lowell Miyagi¹, Sébastien Merkel¹, Takehiko Yagi², Nagayoshi Sata³, Yasuo Ohishi⁴ and Hans-Rudolf Wenk¹
¹ Department of Earth and Planetary Science, University of California, Berkeley, CA 94720, USA
² Institute for Solid State Physics, University of Tokyo, Kashiwanoha 5-1-5, Kashiwa, Chiba 277-8581, Japan
³ Institute for Research on Earth Evolution, Japan Agency for Marine-Earth Science and Technology, Natsushima-cho, Yokosuka, Kanagawa 237-0061, Japan
⁴ Japan Synchrotron Radiation Research Institute, Mikazuki-cho, Sayo-gun, Hyogo 679-5198, Japan

Abstract. The Rietveld method is used to extract quantitative texture information from a single synchrotron diffraction image of a CaSiO₃ perovskite sample deformed in axial compression in a diamond anvil cell. The image used for analysis was taken in radial geometry at 49 GPa and room temperature. We obtain a preferred orientation of {100} lattice planes oriented perpendicular to the compression direction and this is compatible with ${\{}110{\}}\langle 1\bar {1}0\rangle$ slip.

Print publication: Issue 25 (28 June 2006)
Received 30 November 2005, in final form 25 April 2006
Published 8 June 2006

Post to CiteUlike |

Post to Connotea |

Post to Bibsonomy

Quantitative Rietveld texture analysis of CaSiO₃ perovskite deformed in a diamond anvil cell

Find related articles

Article options

Authors & Referees