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X-ray diffraction evaluation of stress in high pressure deformation experiments

Sébastien Merkel 2006 J. Phys.: Condens. Matter 18 S949-S962   doi: 10.1088/0953-8984/18/25/S03  Help

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Sébastien Merkel1
Department of Earth and Planetary Science, University of California, 307 McCone Hall, Berkeley, CA 94720-4767, USA
1 Present address: Laboratoire de Structure et Propriétés de l'Etat Solide (UMR CNRS 8008), Université des Sciences et Technologies de Lille, 59655 Villeneuve d'Ascq, France
E-mail: sebastien.merkel@univ-lille1.fr

Abstract. This paper explores the applicability of x-ray diffraction measurements of stress to high pressure deformation experiments. We model measurements of elastic lattice strains in various geometries for both axial and rotational deformation apparatus. We then show that, for most cases, stresses can be inverted from the diffraction data. A comparison between the results of our models and actual experimental data also indicates that plastic deformation can have an influence that is not addressed properly in the elastic models of lattice strains and should therefore be treated with caution.

Print publication: Issue 25 (28 June 2006)
Received 30 November 2005, in final form 27 February 2006
Published 8 June 2006

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