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Magnetic domains in Ni–Mn–Ga martensitic thin films

V A Chernenko et al 2005 J. Phys.: Condens. Matter 17 5215-5224   doi: 10.1088/0953-8984/17/34/006  Help

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V A Chernenko1,4, R Lopez Anton2, M Kohl1, M Ohtsuka3, I Orue2 and J M Barandiaran2
1 IMT, Forschungszentrum Karlsruhe, D-76021, Karlsruhe, Germany
2 Universidad del País Vasco, Departamento de Electricidad y Electrónica, PO Box 644, E-48080 Bilbao, Spain
3 IMRAM, Tohoku University, Sendai 980-8577, Japan
4 Author to whom any correspondence should be addressed. On leave from: Institute of Magnetism, Vernadsky street 36-b, Kyiv 03142, Ukraine
E-mail: volodymyr{_}chern@yahoo.com

Abstract. A series of martensitic Ni52Mn24Ga24 thin films deposited on alumina ceramic substrates has been prepared by using RF (radio-frequency) magnetron sputtering. The film thickness, d, varies from 0.1 to 5.0 µm. Magnetic domain patterns have been imaged by the MFM (magnetic force microscopy) technique. A maze domain structure is found for all studied films. MFM shows a large out-of-plane magnetization component and a rather uniform domain width for each film thickness. The domain width, δ, depends on the film thickness as \delta \sim \sqrt {d} in the whole studied range of film thickness. This dependence is the expected one for magnetic anisotropy and magnetostatic contributions in a perpendicular magnetic domain configuration. The proportionality coefficient is also consistent with the values of saturation magnetization and magnetic anisotropy determined in the samples.

Print publication: Issue 34 (31 August 2005)
Received 15 April 2005, in final form 30 June 2005
Published 12 August 2005

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