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2005 J. Phys.: Condens. Matter 17 5215-5224 doi: 10.1088/0953-8984/17/34/006
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Abstract.
A series of martensitic Ni52Mn24Ga24
thin films deposited on alumina ceramic substrates has been prepared
by using RF (radio-frequency) magnetron sputtering. The film thickness,
d, varies
from 0.1 to 5.0 µm. Magnetic domain patterns have been imaged by the MFM (magnetic force
microscopy) technique. A maze domain structure is found for all studied
films. MFM shows a large out-of-plane magnetization component and a
rather uniform domain width for each film thickness. The domain width,
δ, depends on the film thickness as
in the whole studied range of film thickness. This dependence is the expected one for
magnetic anisotropy and magnetostatic contributions in a perpendicular magnetic domain
configuration. The proportionality coefficient is also consistent with the values of
saturation magnetization and magnetic anisotropy determined in the samples.
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