Correlated dewetting patterns in thin polystyrene films

doi:10.1088/0953-8984/15/1/358

Correlated dewetting patterns in thin polystyrene films

Chiara Neto et al 2003 J. Phys.: Condens. Matter 15 S421-S426 doi: 10.1088/0953-8984/15/1/358

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Chiara Neto¹, Karin Jacobs^1,4, Ralf Seemann¹, Ralf Blossey², Jürgen Becker³ and Günther Grün³
¹ Department of Applied Physics, University of Ulm, Albert Einstein Allee 11, D-89069 Ulm, Germany
² Centre for Bioinformatics, Saarland University, PO Box 151150, D-66041 Saarbrücken, Germany
³ Institute of Applied Mathematics, University of Bonn, Beringstr. 6, D-53115 Bonn, Germany
E-mail: karin.jacobs@physik.uni-ulm.de
⁴ Author to whom any correspondence should be addressed. On leave from Universität des Saarlandes, Fachbereich Experimentelle Physik, D-66123 Saarbrücken, Germany.

Abstract. We describe preliminary results of experiments and simulations concerned with the dewetting of thin polystyrene films (thickness < 7 nm) on top of silicon oxide wafers. In the experiments we scratched an initially flat film with an atomic force microscopy (AFM) tip, producing dry channels in the film. Dewetting of the films was imaged in situ using AFM and a correlated pattern of holes ('satellite holes') was observed along the rims bordering the channels. The development of this complex film rupture process was simulated and the results of experiments and simulations are in good agreement. On the basis of these results, we attempt to explain the appearance of satellite holes and their positions relative to pre-existing holes.

Print publication: Issue 1 (15 January 2003)
Received 24 October 2002
Published 16 December 2002

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Correlated dewetting patterns in thin polystyrene films

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