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Direct inversion of low-energy electron diffraction (LEED) IV spectra: the surface Patterson function*

S Y Tong et al 2002 J. Phys.: Condens. Matter 14 1231-1236   doi: 10.1088/0953-8984/14/6/310  Help

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S Y Tong1,2 and Huasheng Wu1
1 Department of Physics, The University of Hong Kong, Hong Kong, People's Republic of China
2 Department of Physics and Materials Science, City University of Hong Kong, Hong Kong, People's Republic of China

Abstract. We review the symmetrized data acquisition method for producing artifact-free Patterson functions from low-energy electron diffraction (LEED) IV spectra. The differences between LEED Patterson functions and LEED holograms are discussed.

This article was originally intended to be part of the special issue on holographic and other direct methods for surface structures using electrons and photons which was published as issue 47, volume 13.

Print publication: Issue 6 (18 February 2002)
Received 2 November 2001, in final form 26 November 2001
Published 1 February 2002

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