Characterization of the transient thermal-lens effect using top-hat beam Z-scan

doi:10.1088/0953-4075/42/22/225404

Characterization of the transient thermal-lens effect using top-hat beam Z-scan

Junyi Yang et al 2009 J. Phys. B: At. Mol. Opt. Phys. 42 225404 (5pp) doi: 10.1088/0953-4075/42/22/225404

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Junyi Yang¹, Yuxiao Wang², Xueru Zhang², Changwei Li², Xiao Jin², Min Shui² and Yinglin Song¹
¹ School of Physical Science and Technology, Soochow University, Suzhou 215006, People's Republic of China
² Department of Physics, Harbin Institute of Technology, Harbin 15001, People's Republic of China
E-mail: ylsong@hit.edu.cn

Abstract. The transient thermal-lens effect in a solution is investigated by using the top-hat beam Z-scan technique. The numerical results show that the sensitivity of the top-hat beam Z-scan measurements is about 3.5 times greater than the Gaussian beams for the transient thermal-lens effect when the phase shift is small, which is greater than that for the Kerr effect and the steady-state thermal-lens effect. The reasons are also discussed in detail.

Print publication: Issue 22 (28 November 2009)
Received 20 May 2009, in final form 22 September 2009
Published 30 October 2009

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Characterization of the transient thermal-lens effect using top-hat beam Z-scan

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