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thin films by scanning Hall probe microscopy 1997 Supercond. Sci. Technol. 10 17-20 doi: 10.1088/0953-2048/10/1/003
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School of Physics, University of Bath, Claverton Down, Bath BA2 7AY, UK DRA Electronics Division, St Andrew's Road, Malvern, Worcestershire WR14 3PS, UKAbstract.
We have used a low noise scanning Hall probe microscope to measure the penetration depth microscopically in a 
thin film as a function of temperature. The instrument has high magnetic field (
at 77 K) and spatial resolution (
). Magnetic field profiles of single vortices in the superconducting film have been successfully measured and the microscopic penetration depth of the superconductor has been extracted. We find surprisingly large variations in values of 
for different vortices within the scanning field.
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