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Experimental results on hard x-ray energy emitted by a low-energy plasma focus device: a radiographic image analysis

Marcelo Zambra et al 2009 Plasma Phys. Control. Fusion 51 125003 (10pp)   doi: 10.1088/0741-3335/51/12/125003  Help

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Marcelo Zambra1,2, Patricio Silva, Cristian Pavez1,2, Denisse Pasten1,3, José Moreno1,2 and Leopoldo Soto1,2
1 Comisión Chilena de Energía Nuclear, Amunátegui 95, PO Box 188-D, Santiago, Chile
2 Center for Research and Applications in Plasma Physics and Pulsed Power, P4, PO Box 188-D, Santiago, Chile
3 Facultad de Ciencias, Universidad de Chile, Las Palmeras 3425, Santiago, Chile
E-mail: mzambra@cchen.cl

Abstract. The PF-400J plasma focus device (400 J of energy) was studied in a similar way to a pulsed source of high-energy x-ray radiation. High-sensitivity fast-response commercial radiographic film and different metal filter array combinations were used to study the energy of the proper emitted x-ray. The effective energy of the hard x-ray radiation is studied and discussed in terms of its effective mean attenuation with the penetration distance on different metallic samples when the x-ray pulsed beam is supposed monoenergetic. These results were then used to assess the energetic properties of the pulsed radiation when different x-ray film–filter array combinations were irradiated between tens to almost 160 effective pulses of x-ray coming from the PF-400J device.

Print publication: Issue 12 (December 2009)
Received 30 April 2009, in final form 25 September 2009
Published 29 October 2009

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