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An extended diffraction-enhanced imaging method for implementing multiple-image radiography

Cheng-Ying Chou et al 2007 Phys. Med. Biol. 52 1923-1945   doi: 10.1088/0031-9155/52/7/011  Help

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Cheng-Ying Chou1, Mark A Anastasio1, Jovan G Brankov2, Miles N Wernick1,2, Eric M Brey1,3, Dean M Connor Jr4 and Zhong Zhong4
1 Department of Biomedical Engineering, Illinois Institute of Technology, 10 West 32nd Street, E1-116, Chicago, IL 60616, USA
2 Department of Electrical and Computer Engineering, Illinois Institute of Technology, 3301 South Dearborn Street, Suite 103 Siegel Hall, Chicago, IL 60616, USA
3 Edward J. Hines, Jr. VA Hospital, Research Services, Hines, IL, USA
4 National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973, USA
E-mail: anastasio@iit.edu

Abstract. Diffraction-enhanced imaging (DEI) is an analyser-based x-ray imaging method that produces separate images depicting the projected x-ray absorption and refractive properties of an object. Because the imaging model of DEI does not account for ultra-small-angle x-ray scattering (USAXS), the images produced in DEI can contain artefacts and inaccuracies in medical imaging applications. In this work, we investigate an extended DEI method for concurrent reconstruction of three images that depict an object's projected x-ray absorption, refraction and USAXS properties. The extended DEI method can be viewed as an implementation of the recently proposed multiple-image radiography paradigm. Validation studies are conducted by use of computer-simulated and synchrotron measurement data.

Print publication: Issue 7 (7 April 2007)
Received 23 August 2006, in final form 18 December 2006
Published 16 March 2007

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