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The Ornstein–Uhlenbeck process as a model of a low pass filtered white noise

Enrico Bibbona et al 2008 Metrologia 45 S117-S126   doi: 10.1088/0026-1394/45/6/S17  Help

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Enrico Bibbona1,3, Gianna Panfilo2 and Patrizia Tavella1
1 I.N.RI.M—Istituto Nazionale di Ricerca Metrologica, Strada delle Cacce, 91, 10135 Torino, Italy
2 BIPM, Pavillon de Breteuil, F-92312 Sèvres Cedex, France
3 Also at: Department of Mathematics, University of Torino, Via Carlo Alberto 10, 10123 Torino, Italy.
E-mail: enrico.bibbona@unito.it, gpanfilo@bipm.org and p.tavella@inrim.it

Abstract. The Ornstein–Uhlenbeck process is presented with its main mathematical properties and with original results on the first crossing times in the case of two threshold barriers. The interpretation of filtered white noise, its stationary spectrum and Allan variance are also presented for ease of use in the time and frequency metrology field. An improved simulation scheme for the evaluation of first passage times between two barriers is also introduced.

Print publication: Issue 6 (December 2008)
Received 16 July 2008
Published 5 December 2008

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