Determination of the Avogadro constant via the silicon route

doi:10.1088/0026-1394/40/5/010

Determination of the Avogadro constant via the silicon route

P Becker et al 2003 Metrologia 40 271-287 doi: 10.1088/0026-1394/40/5/010

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P Becker¹, H Bettin¹, H-U Danzebrink¹, M Gläser¹, U Kuetgens¹, A Nicolaus¹, D Schiel¹, P De Bièvre², S Valkiers² and P Taylor²
¹ Physikalisch-Technische Bundesanstalt Braunschweig, Bundesallee 100, 38116 Braunschweig, Germany
² Institute for Reference Materials and Measurements EC-JRC, Retieseweg, 2460 Geel, Belgium
E-mail: peter.becker@ptb.de

Abstract. A value for the Avogadro constant, N_A, was derived from new measurements of the lattice parameter, the density and the molar mass of a silicon single crystal. The result N_A = 6.022 135 3 × 10²³ mol⁻¹ has a relative measurement uncertainty $u_{N_{\rm A}} = 3.4 \times 10^{ - 7}$ and is in excellent agreement with other published data based on the x-ray crystal density molar mass method, indicating the high repeatability of these experiments. The value differs significantly from the Committee on Data for Science and Technology's most recent recommended value of 6.022 141 99 × 10²³ mol⁻¹ by more than 1 × 10⁻⁶ N_A.

Print publication: Issue 5 (October 2003)
Received 9 May 2003
Published 11 September 2003

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Determination of the Avogadro constant via the silicon route

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