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Absolute frequency measurements of 633 nm iodine-stabilized helium–neon lasers

S N Lea et al 2003 Metrologia 40 84-88   doi: 10.1088/0026-1394/40/2/313  Help

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S N Lea1, W R C Rowley1, H S Margolis1, G P Barwood1, G Huang1, P Gill1, J-M Chartier2 and R S Windeler3
1 National Physical Laboratory (NPL), Queens Road, Teddington, Middlesex TW11 0LW, UK
2 Bureau International des Poids et Mesures (BIPM), Pavillon de Breteuil, F-92312 Sèvres Cedex, France
3 OFS, 700 Mountain Avenue, Murray Hill, New Jersey 070974, USA
E-mail: stephen.lea@npl.co.uk

Abstract. The frequency of a helium–neon laser stabilized to the hyperfine component f (alternatively denoted a16) of the 127I2 11-5 R(127) line at 633 nm has been measured with respect to the SI second using a femtosecond optical frequency comb generator based on a mode-locked Ti : sapphire laser and microstructure fibre. The standard uncertainty of this measurement is 0.6 kHz. The same laser was taken to BIPM mid-way through the measurements and its frequency compared to that of the BIPM's continuously maintained iodine-stabilized helium–neon laser BIPM-4. From this comparison, the frequency of BIPM-4 when stabilized to the same iodine hyperfine component f is 473 612 353 608.1 (0.7) kHz.

Print publication: Issue 2 (April 2003)
Received 6 November 2002
Published 1 April 2003

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