Pinhole formation in fluorescent lamps

doi:10.1088/0022-3727/37/20/012

Pinhole formation in capacitively coupled external electrode fluorescent lamps

Guangsup Cho et al 2004 J. Phys. D: Appl. Phys. 37 2863-2867 doi: 10.1088/0022-3727/37/20/012

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Guangsup Cho¹, Jooyoung Lee¹, Deaheung Lee¹, Jehuan Koo¹, Eunha Choi¹, Bongsoo Kim², Sanghun Lee², Minsoon Pak², Junegill Kang² and John P Verboncoeur³
¹ Department of Electrophysics, Kwangwoon University, 447-1, Wallgye-Dong, Nowon-Gu, Seoul 139-701, Korea
² Department of Electrical Engineering, Kwangwoon University, 447-1, Wallgye-Dong, Nowon-Gu, Seoul 139-701, Korea
³ Department of Nuclear Engineering, University of California, Berkeley, CA 94720-1730, USA
E-mail: gscho@daisy.kw.ac.kr

Abstract. Application of power higher than the optimum operation value to an external electrode fluorescent lamp (EEFL) leads to the formation of pinholes, which subsequently leads to lamp failure. Small holes, called pinholes, are formed through the external electrode and the glass tube when a high voltage with a high power is applied. The phenomenon of pinhole formation has been investigated, including the conditions under which they occur and the characteristics such as size and location on the electrode. Pinhole formation has been analysed and shown to be the insulation layer breakdown of glass in the dielectric barrier discharge of capacitively coupled EEFLs.

Print publication: Issue 20 (21 October 2004)
Received 7 May 2004, in final form 2 September 2004
Published 29 September 2004

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Pinhole formation in capacitively coupled external electrode fluorescent lamps

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