Abstract. I review some of the novel methods for measuring ferromagnetic properties of thin films based on micromechanical magnetometers and put them into context relative to current research on nanomagnetism. Measurements rely on the detection of mechanical forces or torques on thin films deposited onto microcantilevers. Displacements of the cantilever are detected by optical methods similar to those developed for atomic force microscopy. High sensitivities are achieved by integrating the sample with the detector, allowing magnetic measurements of samples with a total magnetic moment smaller than that detectable with conventional magnetometers. Cantilevers with low spring constants and high mechanical Q are essential for these measurements. Sensitivities better than 10⁵ μ_B are possible at room temperature with the potential for single spin detection below 1 K, where the thermomechanical noise of micromechanical sensors is substantially reduced.

Print publication: Issue 5 (7 March 2003)
Received 3 October 2002
Published 14 February 2003